Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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02/18/2014
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Application #:
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12451703
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Filing Dt:
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11/25/2009
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Publication #:
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Pub Dt:
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07/01/2010
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Inventor:
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Manabu Nakamura
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Title:
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DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD FOR SILICON WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 5-12, ITACHIBORI 2-CHOME, NISHI-KU |
| OSAKA-SHI |
| OSAKA, JAPAN 550-0012 |
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| ROBERT H. BERDO, JR. |
| RABIN & BERDO, PC |
| 1101 14TH ST., NW |
| SUITE 500 |
| WASHINGTON, DC 20005 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| YOKOHAMA EAST SQUARE |
| 1-4 KINKO-CHO, KANAGAWA-KU |
| YOKOHAMA-CITY, KANAGAWA, JAPAN 221-0056 |
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| BOZICEVIC, FIELD & FRANCIS LLP |
| 201 REDWOOD SHORES PARKWAY |
| SUITE 200 |
| REDWOOD CITY, CA 94065 |
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