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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
04/01/2014
Application #:
13172179
Filing Dt:
06/29/2011
Publication #:
Pub Dt:
01/03/2013
Inventors:
Matthew S. Grady, Mark C. Johnson, Bradley D. Pepper, Dean G. Percy, Joseph C. Pranys
Title:
INTEGRATED CIRCUIT TEST OPTIMIZATION USING ADAPTIVE TEST PATTERN SAMPLING ALGORITHM
Assignment: 1
Reel/Frame:
026522/0296Recorded: 06/29/2011Pages: 6
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/28/2011
Exec Dt:
06/29/2011
Exec Dt:
06/28/2011
Exec Dt:
06/24/2011
Exec Dt:
06/24/2011
Assignee:
NEW ORCHARD ROAD
ARMONK, NEW YORK 10504
Correspondent:
CANTOR COLBURN LLP-IBM BURLINGTON
20 CHURCH STREET
22ND FLOOR
HARTFORD, CT 06103

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