Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/06/2014
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Application #:
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13549847
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Filing Dt:
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07/16/2012
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Inventors:
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Paul MACDONALD, Hong XIAO
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Title:
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METHODS AND APPARATUS TO REVIEW DEFECTS USING SCANNING ELECTRON MICROSCOPE WITH MULTIPLE ELECTRON BEAM CONFIGURATIONS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1 TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| OKAMOTO & BENEDICTO LLP |
| P.O. BOX 641330 |
| SAN JOSE, CA 95164-1330 |
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