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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
07/01/2014
Application #:
13336946
Filing Dt:
12/23/2011
Publication #:
Pub Dt:
06/28/2012
Inventor:
Hiroshi TATENO
Title:
SECONDARY-ELECTRON DETECTOR AND CHARGED PARTICLE BEAM APPARATUS
Assignment: 1
Reel/Frame:
028125/0842Recorded: 04/25/2012Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
04/17/2012
Assignee:
75-1, HASUNUMA-CHO, ITABASHI-KU
TOKYO 174-8580, JAPAN
Correspondent:
KUBOVCIK & KUBOVCIK
SUITE 1105, CRYSTAL GATEWAY 3
1215 SOUTH CLARK STREET
ARLINGTON, VA 22202
Assignment: 2
Reel/Frame:
030525/0651Recorded: 05/31/2013Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
05/17/2013
Assignee:
2, MIYANOHIGASHI, KISSHOIN, MINAMI-KU
KYOTO, JAPAN
Correspondent:
KUBOVCIK & KUBOVCIK
CRYSTAL GATEWAY 3
SUITE 1105
1215 SOUTH CLARK STREET
ARLINGTON, VA 22202

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