Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/12/2014
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Application #:
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13530774
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Filing Dt:
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06/22/2012
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Publication #:
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Pub Dt:
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01/03/2013
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Inventors:
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NanChang Zhu, Derrick Shaughnessy, Houssam Chouaib, Yaolei Zheng, Lu Yu, Jianli Cui, Jin An et al
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Title:
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SYSTEM AND METHOD FOR NONDESTRUCTIVELY MEASURING CONCENTRATION AND THICKNESS OF DOPED SEMICONDUCTOR LAYERS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| SUITER SWANTZ/KLA JOINT CUSTOMER NUMBER |
| 14301 FNB PARKWAY |
| SUITE 220 |
| OMAHA, NE 68154-5299 |
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