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Patent Assignment Abstract of Title
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Total Assignments: 3
Patent #:
Issue Dt:
11/18/2014
Application #:
13539778
Filing Dt:
07/02/2012
Publication #:
Pub Dt:
01/02/2014
Inventors:
Mark C. Reuter, Bojan R. Ilic, Sandip Tiwari, Brian A. Bryce
Title:
Scanned Probe Microscopy (SPM) Probe Having Angled Tip
Assignment: 1
Reel/Frame:
028476/0508Recorded: 07/02/2012Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
06/06/2012
Assignee:
NEW ORCHARD ROAD
ARMONK, NEW YORK 10504
Correspondent:
CANTOR COLBURN LLP-IBM YORKTOWN
20 CHURCH STREET
22ND FLOOR
HARTFORD, CT 06103
Assignment: 2
Reel/Frame:
028476/0542Recorded: 07/02/2012Pages: 6
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/06/2012
Exec Dt:
06/06/2012
Exec Dt:
06/29/2012
Assignee:
395 PINE TREE ROAD
SUITE 310
ITHACA, NEW YORK 14850
Correspondent:
CANTOR COLBURN LLP-IBM YORKTOWN
20 CHURCH STREET
22ND FLOOR
HARTFORD, CT 06103
Assignment: 3
Reel/Frame:
039400/0481Recorded: 07/20/2016Pages: 2
Conveyance:
CONFIRMATORY LICENSE (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
07/18/2016
Assignee:
4201 WILSON BLVD
ROOM 1265
ARLINGTON, VIRGINIA 22230
Correspondent:
NATIONAL SCIENCE FOUNDATION
4201 WILSON BLVD
ROOM 1265
ARLINGTON, VA 22230

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