Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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12/30/2014
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Application #:
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13212585
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Filing Dt:
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08/18/2011
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Publication #:
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Pub Dt:
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03/01/2012
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Inventors:
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Kohei KATO, Koichi SHIROYAMA, Akinori SHIRAISHI, Shigeru MATSUMURA, Katsushi SUGAI et al
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Title:
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TEST-USE INDIVIDUAL SUBSTRATE, PROBE, AND SEMICONDUCTOR WAFER TESTING APPARATUS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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32-1 ASAHICHO, NERIMA-KU |
TOKYO, JAPAN 179-0071 |
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GREENBLUM & BERNSTEIN |
1950 ROLAND CLARKE PLACE |
RESTON, VA 20191 |
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Assignment:
2
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CORRECTIVE ASSIGNMENT TO CORRECT THE OMISSION OF SECOND ASSIGNEE PREVIOUSLY RECORDED ON REEL 027018 FRAME 0056. ASSIGNOR(S) HEREBY CONFIRMS THE TO ADD SECOND ASSIGNEE SHINKO ELECTRIC INDUSTRIES CO.,LTD., 80, OSHIMADA-MACHI, NAGANO-SHI, NAGANO 381-2287, JAPAN.
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32-1 ASAHICHO, NERIMA-KU |
TOKYO, JAPAN 179-0071 |
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80, OSHIMADA-MACHI, NAGANO-SHI |
NAGANO, JAPAN 381-2287 |
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GREENBLUM & BERNSTEIN |
1950 ROLAND CLARKE PLACE |
RESTON, VA 20191 |
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04/27/2024 02:06 AM
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