Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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02/03/2015
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Application #:
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13041003
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Filing Dt:
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03/04/2011
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Publication #:
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Pub Dt:
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06/21/2012
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Inventors:
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Dae-Suk KIM, Jong-Chern LEE, Chul KIM
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Title:
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INTEGRATED CIRCUIT FOR DETECTING DEFECTS OF THROUGH CHIP VIA
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| SAN 136-1, AMI-RI, BUBAL-EUP, ICHEON-SI, |
| GYEONGGI-DO,, KOREA, REPUBLIC OF 467-701 |
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| IP & T GROUP LLP |
| 7700 LITTLE RIVER TURNPIKE |
| SUITE 207 |
| ANNANDALE, VA 22003 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| 2091, GYEONGCHUNG-DAERO, BUBAL-EUB, ICHEON-SI |
| GYEONGGI-DO, KOREA, REPUBLIC OF |
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| IP & T GROUP LLP |
| 8230 LEESBURG PIKE SUITE 650 |
| VIENNA, VA 22182 |
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