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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
04/14/2015
Application #:
12992236
Filing Dt:
02/10/2011
Publication #:
Pub Dt:
06/02/2011
Inventors:
Philippe Gastaldo, Fran¿ois Berger, Cleonisse Serrecchia
Title:
DEVICE AND METHOD FOR INSPECTING SEMICONDUCTOR WAFERS
Assignment: 1
Reel/Frame:
025790/0235Recorded: 02/10/2011Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
01/18/2011
Exec Dt:
01/18/2011
Exec Dt:
01/18/2011
Assignee:
611, RUE ARISTIDE
BERGES
MONTBONNOT-SAINT-MARTIN, FRANCE F-38330
Correspondent:
JACKIE PITRE
700 LAVACA
SUITE 800
AUSTIN, TX 78701
Assignment: 2
Reel/Frame:
045365/0121Recorded: 12/15/2017Pages: 4
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
07/18/2016
Assignee:
611 RUE ARISTIDE BERGÈS
MONTBONNOT SAINT-MARTIN, FRANCE 38330
Correspondent:
MEYERTONS HOOD KIVLIN KOWERT& GOETZEL
1120 SOUTH CAPITAL OF TEXAS HWY
BLDG. 2, SUITE 300
AUSTIN, TX 78746

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