Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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04/21/2015
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Application #:
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13006739
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Filing Dt:
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01/14/2011
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Inventors:
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NING FANG, WEI SUN
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Title:
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AUTO-CALIBRATED SCANNING-ANGLE PRISM-TYPE TOTAL INTERNAL REFLECTION MICROSCOPY FOR NANOMETER-PRECISION AXIAL POSITION DETERMINATION AND OPTIONAL VARIABLE-ILLUMINATION-DEPTH PSEUDO TOTAL INTERNAL REFLECTION MICROSCOPY
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 310 LAB OF MECHANICS |
| AMES, IOWA 50011-0778 |
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| MCKEE, VOORHEES & SEASE, PLC |
| 801 GRAND AVENUE |
| SUITE 3200 |
| DES MOINES, IA 50309-2721 |
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Assignment:
2
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CONFIRMATORY LICENSE (SEE DOCUMENT FOR DETAILS).
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| 1000 INDEPENDENCE AVENUE, S.W. |
| WASHINGTON, DISTRICT OF COLUMBIA 20585 |
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| MARK P. DVORSCAK |
| U. S. DEPT. OF ENERGY, IPLD |
| 9800 S. CASS AVENUE |
| ARGONNE, IL 60439 |
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