Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/28/2015
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Application #:
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13879967
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Filing Dt:
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04/17/2013
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Publication #:
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Pub Dt:
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08/22/2013
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Inventors:
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Jibin Zou, Runsheng Wang, Yangyuan Wang, Ru Huang, Changze Liu, Jiewen Fan
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Title:
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METHOD FOR TESTING DENSITY AND LOCATION OF GATE DIELECTRIC LAYER TRAP OF SEMICONDUCTOR DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO. 5 YIHEYUAN ROAD |
| HAIDIAN DISTRICT |
| BEIJING, CHINA 100871 |
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| BOZICEVIC, FIELD & FRANCIS LLP |
| 1900 UNIVERSITY AVE., SUITE 200 |
| EAST PALO ALTO, CA 94303 |
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