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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
09/01/2015
Application #:
13820575
Filing Dt:
03/04/2013
Publication #:
Pub Dt:
08/15/2013
Inventors:
Jong Han Jin, Jae Wan Kim, Jong Ahn Kim, Chu-Shik Kang
Title:
DEVICE AND METHOD FOR MEASURING VIA HOLE OF SILICON WAFER
Assignment: 1
Reel/Frame:
029915/0717Recorded: 03/04/2013Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/26/2013
Exec Dt:
02/26/2013
Exec Dt:
02/26/2013
Exec Dt:
02/26/2013
Assignee:
1, DORYONG-DONG, YUSEONG-GU
DAEJEON, KOREA, REPUBLIC OF 305-340
Correspondent:
CANTOR COLBURN LLP
20 CHURCH STREET
22ND FLOOR
HARTFORD, CT 06103

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