Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/13/2015
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Application #:
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13504289
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Filing Dt:
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06/18/2012
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Publication #:
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Pub Dt:
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12/06/2012
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Inventors:
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Andreas Ortner, Hilmar Von Campe, Klaus Gerstner, Michael Stelzl
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Title:
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METHOD AND DEVICE FOR DETECTING CRACKS IN SEMICONDUCTOR SUBSTRATES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| HATTENBERGSTRASSE 10 |
| MAINZ, GERMANY 55122 |
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| OHLANDT, GREELEY, RUGGIERO & PERLE, LLP |
| ONE LANDMARK SQUARE, 10TH FLOOR |
| STAMFORD, CT 06901 |
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