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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
10/13/2015
Application #:
14071352
Filing Dt:
11/04/2013
Publication #:
Pub Dt:
05/07/2015
Inventors:
Shih-Ming Chang, Chih-Ming Lai, Hung-Chang Hsieh
Title:
Method and System for Repairing Wafer Defects
Assignment: 1
Reel/Frame:
032461/0684Recorded: 03/18/2014Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
10/30/2013
Exec Dt:
10/30/2013
Exec Dt:
10/30/2013
Assignee:
NO. 8, LI-HSIN RD. 6
SCIENCE-BASED INDUSTRIAL PARK
HSIN-CHU, TAIWAN 300-77
Correspondent:
HAYNES AND BOONE, LLP IP SECTION
2323 VICTORY AVENUE
SUITE 700
DALLAS, TX 75219

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