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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
01/19/2016
Application #:
12830810
Filing Dt:
07/06/2010
Publication #:
Pub Dt:
10/28/2010
Inventors:
Charles A. Taylor II, Darryl Barlett, Douglas Perry, Roy Clarke, Jason Williams
Title:
APPARATUS AND METHOD FOR REAL TIME MEASUREMENT OF SUBSTRATE TEMPERATURES FOR USE IN SEMICONDUCTOR GROWTH AND WAFER PROCESSING
Assignment: 1
Reel/Frame:
024638/0294Recorded: 07/06/2010Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
09/05/2006
Exec Dt:
09/05/2006
Exec Dt:
09/01/2006
Exec Dt:
09/01/2006
Exec Dt:
09/01/2006
Assignee:
2182 BISHOP CIRCLE EAST
DEXTER, MICHIGAN 48130
Correspondent:
DICKINSON WRIGHT PLLC
38525 WOODWARD AVENUE
SUITE 2000
BLOOMFIELD HILLS, MI 48304-2970

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