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Patent Assignment Abstract of Title
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Total Assignments: 3
Patent #:
Issue Dt:
03/01/2016
Application #:
14013753
Filing Dt:
08/29/2013
Inventors:
WENKAN JIANG, BRADLEY C. DOWNEY, DIRK EHRENTRAUT, MARK P. D'EVELYN
Title:
METHOD FOR QUANTIFICATION OF EXTENDED DEFECTS IN GALLIUM-CONTAINING NITRIDE CRYSTALS
Assignment: 1
Reel/Frame:
037504/0154Recorded: 01/15/2016Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
09/05/2012
Exec Dt:
08/31/2012
Exec Dt:
09/05/2012
Exec Dt:
08/31/2012
Assignee:
6500 KAISER DRIVE
FREMONT, CALIFORNIA 94555
Correspondent:
STEPHEN J. DRISCOLL
SAUL EWING LLP
1500 MARKET STREET, 38TH FLOOR
PHILADELPHIA, PA 19102
Assignment: 2
Reel/Frame:
033481/0557Recorded: 08/06/2014Pages: 2
Conveyance:
CONFIRMATORY LICENSE (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
11/14/2013
Assignee:
4201 WILSON BLVD
ROOM 1265
ARLINGTON, VIRGINIA 22230
Correspondent:
NATIONAL SCIENCE FOUNDATION
4201 WILSON BLVD
ROOM 1265
ARLINGTON, VA 22230
Assignment: 3
Reel/Frame:
044636/0918Recorded: 10/23/2017Pages: 12
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
09/08/2017
Assignee:
C/O LOEB & LOEB
10100 SANTA MONICA BLVD., SUITE 2200
LOS ANGELES, CALIFORNIA 90067
Correspondent:
PATTERSON & SHERIDAN LLP
24 GREENWAY PLAZA
SUITE 1600
HOUSTON, TX 77046

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