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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
04/05/2016
Application #:
14195390
Filing Dt:
03/03/2014
Publication #:
Pub Dt:
09/11/2014
Inventors:
Earl Jensen, Kevin O'Brien
Title:
THICKNESS CHANGE MONITOR WAFER FOR IN SITU FILM THICKNESS MONITORING
Assignment: 1
Reel/Frame:
033148/0480Recorded: 06/20/2014Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/19/2014
Exec Dt:
06/19/2014
Assignee:
1 TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
JOSHUA D. ISENBERG
JDI PATENT
809 CORPORATE WAY
FREMONT, CA 94539

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