Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/26/2016
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Application #:
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14164618
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Filing Dt:
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01/27/2014
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Publication #:
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Pub Dt:
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05/28/2015
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Inventors:
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Shintaro KOBAYASHI, Toru MITSUNAGA, Koichi KAJIYOSHI, Kazuyoshi ARAI
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Title:
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X-RAY DIFFRACTION APPARATUS AND METHOD OF MEASURING X-RAY DIFFRACTION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 9-12, MATSUBARA-CHO, 3-CHOME |
| AKISHIMA-SHI, TOKYO, JAPAN 196-8666 |
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| JAMES A. OLIFF |
| OLIFF, PLC |
| P.O. BOX 320850 |
| ALEXANDRIA, VA 22320-4850 |
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