Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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06/21/2016
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Application #:
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14162894
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Filing Dt:
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01/24/2014
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Publication #:
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Pub Dt:
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07/30/2015
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Inventors:
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Joseph L. Malenfant JR., Steven C. Nash, Brian N. Caldwell, Yuki Fujita et al
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Title:
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TEST PATTERN LAYOUT FOR TEST PHOTOMASK AND METHOD FOR EVALUATING CRITICAL DIMENSION CHANGES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NEW ORCHARD ROAD |
| ARMONK, NEW YORK 10504 |
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| HOFFMAN WARNICK LLC |
| 75 STATE STREET |
| 14TH FLOOR |
| ALBANY, NY 12207 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-51- TAITO, TAITO-KU |
| TOKYO, JAPAN 110-8560 |
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| HOFFMAN WARNICK LLC |
| 540 BROADWAY |
| ALBANY, NY 12207 |
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