skip navigationU S P T O SealUnited States Patent and Trademark Office AOTW logo
Home|Site Index|Search|Guides|Contacts|eBusiness|eBiz alerts|News|Help
Assignments on the Web > Patent Query
Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Total Assignments: 2
Patent #:
Issue Dt:
09/06/2016
Application #:
14656429
Filing Dt:
03/12/2015
Publication #:
Pub Dt:
09/17/2015
Inventors:
Akira NAKAMURA, Hiroaki SHIBUE, Yasumasa HIROO, Hiroshi OTA, Taro TAKAHASHI, Mitsuo TADA
Title:
METHOD OF CORRECTING FILM THICKNESS MEASUREMENT VALUE, FILM THICKNESS CORRECTOR AND EDDY CURRENT SENSOR
Assignment: 1
Reel/Frame:
035233/0658Recorded: 03/23/2015Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
12/24/2014
Exec Dt:
12/24/2014
Exec Dt:
12/25/2014
Exec Dt:
12/26/2014
Exec Dt:
12/24/2014
Assignee:
11-1, HANEDA ASAHI-CHO, OHTA-KU
TOKYO, JAPAN
Correspondent:
BAKER & HOSTETLER LLP
2929 ARCH STREET
CIRA CENTRE, 12TH FLOOR
PHILADELPHIA, PA 19104-2891
Assignment: 2
Reel/Frame:
039307/0692Recorded: 08/01/2016Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
12/24/2014
Assignee:
11-1 HANEDA ASAHI-CHO
OHTA-KU
TOKYO, JAPAN 144-8510
Correspondent:
BAKER & HOSTETLER LLP
2929 ARCH STREET
CIRA CENTRE, 12TH FLOOR
PHILADELPHIA, PA 19104-2891

Search Results as of: 04/28/2024 10:27 PM
If you have any comments or questions concerning the data displayed, contact PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified: August 25, 2017 v.2.6
| .HOME | INDEX| SEARCH | eBUSINESS | CONTACT US | PRIVACY STATEMENT