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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
10/18/2016
Application #:
14973497
Filing Dt:
12/17/2015
Inventors:
GRISELDA BONILLA, ELBERT E. HUANG, CHAO-KUN HU, BAOZHEN LI, PAUL S. MCLAUGHLIN
Title:
ELECTROMIGRATION TEST STRUCTURE FOR CU BARRIER INTEGRITY AND BLECH EFFECT EVALUATIONS
Assignment: 1
Reel/Frame:
037321/0883Recorded: 12/17/2015Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
12/15/2015
Exec Dt:
12/15/2015
Exec Dt:
12/15/2015
Exec Dt:
12/15/2015
Exec Dt:
12/15/2015
Assignee:
NEW ORCHARD ROAD
ARMONK, NEW YORK 10504
Correspondent:
CANTOR COLBURN LLP
20 CHURCH STREET
22ND FLOOR
HARTFORD, CT 06103
Assignment: 2
Reel/Frame:
037399/0052Recorded: 12/30/2015Pages: 7
Conveyance:
CORRECTIVE ASSIGNMENT TO CORRECT THE SECOND INVENTOR EXCUTION DATE PREVIOUSLY RECORDED AT REEL: 037321 FRAME: 0883. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT.
Assignors:
Exec Dt:
12/15/2015
Exec Dt:
12/16/2015
Exec Dt:
12/15/2015
Exec Dt:
12/15/2015
Exec Dt:
12/15/2015
Assignee:
NEW ORCHARD ROAD
ARMONK, NEW YORK 10504
Correspondent:
CANTOR COLBURN LLP
20 CHURCH STREET
22ND FLOOR
HARTFORD, CT 06103

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