Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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11/01/2016
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Application #:
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14062761
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Filing Dt:
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10/24/2013
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Publication #:
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Pub Dt:
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07/31/2014
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Inventors:
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Chien-Huei CHEN, Ajay GUPTA, Thanh Huy HA, Jianwei WANG, Hedong YANG et al
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Title:
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CONTOUR-BASED ARRAY INSPECTION OF PATTERNED DEFECTS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1 TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| OKAMOTO & BENEDICTO LLP |
| P.O. BOX 641330 |
| SAN JOSE, CA 95164-1330 |
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