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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
01/03/2017
Application #:
13895837
Filing Dt:
05/16/2013
Publication #:
Pub Dt:
11/21/2013
Inventors:
Akihiko TODA, Kunito TAKAHASHI, Tatsuya KISHII
Title:
Test Signal Supplying Device and Semiconductor Integrated Circuit
Assignment: 1
Reel/Frame:
030439/0898Recorded: 05/16/2013Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
05/09/2013
Exec Dt:
05/09/2013
Exec Dt:
05/10/2013
Assignee:
10-1, NAKAZAWA-CHO, NAKA-KU
HAMAMATSU-SHI, SHIZUOKA, JAPAN
Correspondent:
CROWELL & MORING LLP
P.O. BOX 14300
INTELLECTUAL PROPERTY GROUP
WASHINGTON, DC 20004

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