Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/28/2017
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Application #:
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14455338
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Filing Dt:
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08/08/2014
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Publication #:
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Pub Dt:
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02/12/2015
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Inventors:
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Tomokazu Kozakai, Osamu Matsuda, Yasuhiko Sugiyama, Kazuo Aita, Fumio Aramaki et al
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Title:
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Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Electron Source, Electron Microscope, Electron Beam Applied Analysis Apparatus, Ion-Electron Multi-Beam Apparatus, Scanning Probe Microscope, and Mask Repair Apparatus
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 24-14, NISHI-SHIMBASHI 1-CHOME |
| MINATO-KU, TOKYO, JAPAN 105-0003 |
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| BANNER & WITCOFF, LTD. |
| 1100 13TH ST. NW |
| STE 1200 |
| WASHINGTON, DC 20005 |
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