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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
04/11/2017
Application #:
13402439
Filing Dt:
02/22/2012
Publication #:
Pub Dt:
08/23/2012
Inventors:
OFER BENJAMIN, IGAL SADE, NASIM NASSER
Title:
METHOD AND APPARATUS FOR TESTING IC
Assignment: 1
Reel/Frame:
027799/0958Recorded: 03/02/2012Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/22/2012
Exec Dt:
02/22/2012
Exec Dt:
02/22/2012
Assignee:
6 HAMADA STREET, MORDOT HACARMEL INDUSTRIAL PARK
YOKNEAM, ISRAEL 20692
Correspondent:
HORACE NG
5488 MARVELL LANE
SANTA CLARA, CA 95054

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