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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
07/04/2017
Application #:
14328460
Filing Dt:
07/10/2014
Publication #:
Pub Dt:
01/15/2015
Inventors:
John DeBauche, Michael Andres, Jeffrey Sherry, Brian Eshult, Dan Campion, Steve Rott et al
Title:
TESTING APPARATUS AND METHOD FOR MICROCIRCUIT AND WAFER LEVEL IC TESTING
Assignment: 1
Reel/Frame:
034362/0634Recorded: 12/03/2014Pages: 16
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
07/16/2014
Exec Dt:
07/16/2014
Exec Dt:
07/21/2014
Exec Dt:
07/16/2014
Exec Dt:
07/16/2014
Exec Dt:
07/16/2014
Exec Dt:
07/16/2014
Assignee:
1210 NEW BRIGHTON BOULEVARD
MINNEAPOLIS, MINNESOTA 55413
Correspondent:
ALTERA LAW GROUP, LLC
121 SOUTH 8TH STREET
SUITE 650
MINNEAPOLIS, MN 55402

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