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Patent Assignment Abstract of Title
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Total Assignments: 3
Patent #:
Issue Dt:
07/25/2017
Application #:
13066219
Filing Dt:
04/08/2011
Publication #:
Pub Dt:
10/11/2012
Inventors:
David S. Marx, David L. Grant
Title:
Wafer shape thickness and trench measurement
Assignment: 1
Reel/Frame:
030766/0357Recorded: 07/10/2013Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
04/26/2013
Assignee:
ONE RUDOLPH ROAD
FLANDERS, NEW JERSEY 07836
Correspondent:
TODD R. FRONEK
DICKE, BILLIG & CZAJA, PLLC
100 SOUTH FIFTH STREET, SUITE 2250
MINNEAPOLIS, MN 55402
Assignment: 2
Reel/Frame:
031001/0193Recorded: 08/13/2013Pages: 10
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
08/01/2013
Exec Dt:
07/31/2013
Assignee:
ONE RUDOLPH ROAD
FLANDERS, NEW JERSEY 07836
Correspondent:
TODD R. FRONEK
DICKE, BILLIG & CZAJA, PLLC
100 SOUTH FIFTH STREET, SUITE 2250
MINNEAPOLIS, MN 55402
Assignment: 3
Reel/Frame:
053117/0623Recorded: 07/02/2020Pages: 84
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
04/30/2020
Assignee:
16 JONSPIN ROAD
WILMINGTON, MASSACHUSETTS 01887
Correspondent:
NESREEN GHEITA
184 SHEPHERDS BUSH ROAD
LONDON, W6 7NL UNITED KINGDOM

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