Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/01/2017
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Application #:
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15258959
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Filing Dt:
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09/07/2016
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Publication #:
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Pub Dt:
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03/09/2017
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Inventor:
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Seung Wook Lee
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Title:
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APPARATUS FOR MEASURING IMPURITIES ON WAFER AND METHOD OF MEASURING IMPURITIES ON WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 274, IMSU-DONG, GUMI-SI |
| GYEONGBUK, KOREA, REPUBLIC OF 730-350 |
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| LEWIS ROCA ROTHGERBER CHRISTIE LLP |
| PO BOX 29001 |
| GLENDALE, CA 91209-9001 |
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