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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
9733194
Issue Dt:
08/15/2017
Application #:
14799741
Filing Dt:
07/15/2015
Publication #:
20160018340
Pub Dt:
01/21/2016
Inventors:
Yuko Otani, Shunji Maeda, Yuta Urano, Toshifumi Honda, Takehiro Hirai, Satoru Takahashi et al
Title:
METHOD FOR REVIEWING A DEFECT AND APPARATUS
Assignment: 1
Reel/Frame:
036104/0011Recorded: 07/15/2015Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
OTANI, YUKO
Exec Dt:
06/09/2015
MAEDA, SHUNJI
Exec Dt:
06/19/2015
URANO, YUTA
Exec Dt:
06/09/2015
HONDA, TOSHIFUMI
Exec Dt:
06/29/2015
HIRAI, TAKEHIRO
Exec Dt:
06/11/2015
TAKAHASHI, SATORU
Exec Dt:
06/18/2015
TAKAMASU, KIYOSHI
Exec Dt:
06/15/2015
Assignees:
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU
TOKYO, JAPAN
THE UNIVERSITY OF TOKYO
3-1, HONGO 7-CHOME
BUNKYO-KU, TOKYO, JAPAN
Correspondent:
MILES & STOCKBRIDGE P.C.
MITCHELL W. SHAPIRO
1751 PINNACLE DRIVE, SUITE 1500
TYSONS CORNER, VA 22102-3833
Assignment: 2
Reel/Frame:
052259/0227Recorded: 03/30/2020Pages: 68
Conveyance:
CHANGE OF NAME AND ADDRESS
Assignor:
HITACHI HIGH-TECHNOLOGIES CORPORATION
Exec Dt:
02/12/2020
Assignee:
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondent:
MATTINGLY & MALUR PC
1800 DIAGONAL ROAD
SUITE 210
ALEXANDRIA, VA 22314

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