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Patent Assignment Abstract of Title
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Total Assignments: 3
Patent #:
Issue Dt:
10/10/2017
Application #:
14636950
Filing Dt:
03/03/2015
Publication #:
Pub Dt:
09/08/2016
Inventors:
Milen Gateshki, Alexander Kharchenko, Petronella Emerentiana Hegeman et al
Title:
Quantitative X-ray Analysis - Matrix thickness correction
Assignment: 1
Reel/Frame:
036420/0747Recorded: 08/21/2015Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
05/20/2015
Exec Dt:
05/20/2015
Exec Dt:
05/22/2015
Exec Dt:
05/20/2015
Exec Dt:
05/21/2015
Assignee:
LELYWEG 1, 7602 EA
P.O. BOX 13
ALMELO, NETHERLANDS 7600 AA
Correspondent:
LEASON ELLIS LLP
ONE BARKER AVENUE
FIFTH FLOOR
WHITE PLAINS, NY 10601
Assignment: 2
Reel/Frame:
036387/0971Recorded: 08/21/2015Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
08/18/2015
Assignee:
LELYWEG 1, 7602 EA
P.O. BOX 13
ALMELO, NETHERLANDS 7600 AA
Correspondent:
LEASON ELLIS LLP
ONE BARKER AVENUE
FIFTH FLOOR
WHITE PLAINS, NY 10601
Assignment: 3
Reel/Frame:
045765/0354Recorded: 01/15/2018Pages: 4
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
11/21/2017
Assignee:
LELYWEG 1, 7602 EA
P O BOX 13
ALMELO, NETHERLANDS 7600 AA
Correspondent:
LEASON ELLIS LLP
ONE BARKER AVENUE
FIFTH FLOOR
WHITE PLAINS, NY 10601

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