Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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11/14/2017
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Application #:
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15031990
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Filing Dt:
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04/25/2016
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Publication #:
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Pub Dt:
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09/29/2016
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Inventors:
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Kazushi HAYASHI, Aya MIKI, Toshihiro KUGIMIYA, Nobuyuki KAWAKAMI
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Title:
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METHOD FOR EVALUATING OXIDE SEMICONDUCTOR THIN FILM, METHOD FOR MANAGING QUALITY OF OXIDE SEMICONDUCTOR THIN FILM, AND EVALUATION ELEMENT AND EVALUATION DEVICE USED IN ABOVE EVALUATION METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2-4, WAKINOHAMA-KAIGANDORI 2-CHOME, CHUO-KU, KOBE-SHI |
| HYOGO, JAPAN 651-8585 |
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| STUDEBAKER & BRACKETT PC |
| 12700 SUNRISE VALLEY DRIVE |
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| RESTON, VA 20191 |
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