Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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12/05/2017
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Application #:
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14484517
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Filing Dt:
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09/12/2014
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Publication #:
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Pub Dt:
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03/19/2015
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Inventors:
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Yeonjoon Park, Hyun Jung KIM, Jonathan R. SKUZA, Kunik LEE, Glen C. KING, Sang Hyouk CHOI
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Title:
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X-ray Diffraction (XRD) Characterization Methods for Sigma=3 Twin Defects in Cubic Semiconductor (100) Wafers
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 300 E. STREET SW |
| WASHINGTON, DISTRICT OF COLUMBIA 20546 |
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| NASA LANGLEY RESEARCH CENTER |
| OFFICE OF CHIEF COUNSEL |
| MAIL STOP 30 |
| HAMPTON, VA 23681-2199 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 300 E. STREET SW |
| WASHINGTON, DISTRICT OF COLUMBIA 20546 |
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| NASA LANGLEY RESEARCH CENTER |
| OFFICE OF CHIEF COUNSEL |
| MAIL STOP 30 |
| HAMPTON, VA 23681-2199 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 300 E. STREET SW |
| WASHINGTON, DISTRICT OF COLUMBIA 20546 |
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| NASA LANGLEY RESEARCH CENTER |
| OFFICE OF CHIEF COUNSEL |
| MAIL STOP 30 |
| HAMPTON, VA 23681-2199 |
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