Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/19/2017
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Application #:
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14443720
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Filing Dt:
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05/19/2015
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Publication #:
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Pub Dt:
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10/22/2015
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Inventors:
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Yoshinobu Kimura, Natsuki Tsuno, Hiroya Ohta, Renichi Yamada, Toshiyuki Ohno, Yuki Mori
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Title:
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SEMICONDUCTOR INSPECTION DEVICE INCLUDING A COUNTER ELECTRODE WITH ADJUSTABLE POTENTIALS USED TO OBTAIN IMAGES FOR DETECTION OF DEFECTS, AND INSPECTION METHOD USING CHARGED PARTICLE BEAM
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Assignment:
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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6-6, MARUNOUCHI 1-CHOME |
CHIYODA-KU, TOKYO, JAPAN 100-8280 |
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ERIC G. KING |
1751 PINNACLE DRIVE, SUITE 1500 |
TYSONS CORNER, VA 22102-3833 |
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