Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/19/2017
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Application #:
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15376486
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Filing Dt:
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12/12/2016
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Publication #:
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Pub Dt:
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03/30/2017
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Inventors:
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Lisheng Gao, David W. Shortt, Kenong Wu, Grace Hsiu-Ling Chen
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Title:
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Detecting Defects on a Wafer Using Defect-Specific and Multi-Channel Information
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Assignment:
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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ONE TECHNOLOGY DRIVE |
MILPITAS, CALIFORNIA 95035 |
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ENTROPY MATTERS LLC |
P.O. BOX 2250 |
NEW YORK, NY 10021 |
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