Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/26/2017
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Application #:
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14978885
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Filing Dt:
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12/22/2015
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Publication #:
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Pub Dt:
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08/04/2016
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Inventor:
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LIANG QIAN
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Title:
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MEMORY TESTING CIRCUIT AND TESTING METHOD USING SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 288 HALEI ROAD, PUDONG NEW AREA |
| SHANGHAI, CHINA 201203 |
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| MG-IP P.C. |
| 4000 LEGATO ROAD |
| SUITE 310 |
| FAIRFAX, VA 22033 |
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