Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
1
|
|
Patent #:
|
|
Issue Dt:
|
01/02/2018
|
Application #:
|
15025880
|
Filing Dt:
|
03/29/2016
|
|
Publication #:
|
|
Pub Dt:
|
08/18/2016
| | | | |
|
Inventor:
|
Kyu Hyung LEE
|
|
Title:
|
METHOD OF MEASURING DEPTH OF DAMAGE OF WAFER
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| 53 IMSU-RO, |
| GUMI-SI, GYEONGSANGBUK-DO, KOREA, REPUBLIC OF 39386 |
|
|
|
|
| KED & ASSOCIATES, LLP |
| P.O. BOX 8638 |
| RESTON, VA 20195 |
|
|
Search Results as of:
06/07/2024 07:13 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
