Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/16/2018
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Application #:
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15236297
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Filing Dt:
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08/12/2016
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Publication #:
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Pub Dt:
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01/12/2017
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Inventors:
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Takashi ISHIMOTO, Yuji SHIGESAWA, Akira YAMAGUCHI, Takashi MOTOYAMA, Takenori TAKAHASHI
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Title:
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Semiconductor Wafer Inspection Apparatus And Semiconductor Wafer Inspection Method
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2968-2, ISHIKAWA-MACHI, HACHIOJI-SHI |
| TOKYO, JAPAN 192-8515 |
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| MORGAN LEWIS & BOCKIUS LLP |
| 1400 PAGE MILL ROAD |
| PALO ALTO, CA 94304 |
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