Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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02/13/2018
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Application #:
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15513290
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Filing Dt:
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03/22/2017
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Publication #:
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Pub Dt:
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10/19/2017
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Inventors:
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Shuai Zhang, Yucheng Chan
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Title:
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TEST ELEMENT GROUP, METHOD OF TESTING ELECTRICAL CHARACTERISTICS OF SEMICONDUCTOR ELEMENTS, AND FABRICATING METHOD THEREOF
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO.10 JIUXIANQIAO RD., CHAOYANG DISTRICT |
| BEIJING, CHINA 100015 |
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| INTELLECTUAL VALLEY LAW, P.C. |
| 39055 HASTINGS ST. SUITE 209 |
| FREMONT, CA 94538 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO.10 JIUXIANQIAO RD., CHAOYANG DISTRICT |
| BEIJING, CHINA 100015 |
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| INTELLECTUAL VALLEY LAW, P.C. |
| 39055 HASTINGS ST. SUITE 209 |
| FREMONT, CA 94538 |
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