Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/20/2018
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Application #:
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14323211
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Filing Dt:
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07/03/2014
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Publication #:
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Pub Dt:
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01/08/2015
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Inventors:
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Jae-Wan KIM, Jong-Ahn KIM, Chu-Shik KANG, Jong-Han JIN
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Title:
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THICKNESS MEASURING APPARATUS AND THICKNESS MEASURING METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 267, GAJEONG-RO, YUSEONG-GU |
| DAEJEON, KOREA, REPUBLIC OF 305-340 |
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| JENKINS, WILSON, TAYLOR & HUNT, P. A. |
| 3100 TOWER BLVD. |
| SUITE 1200 |
| DURHAM, NC 27707 |
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