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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
05/15/2018
Application #:
15436278
Filing Dt:
02/17/2017
Publication #:
Pub Dt:
01/18/2018
Inventor:
Min Sik HAN
Title:
SEMICONDUCTOR TEST DEVICE AND SEMICONDUCTOR TEST METHOD
Assignment: 1
Reel/Frame:
041289/0206Recorded: 02/17/2017Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
02/02/2017
Assignee:
2091, GYEONGCHUNG-DAERO, BUBAL-EUB
ICHEON-SI GYEONGGI-DO, KOREA, REPUBLIC OF
Correspondent:
WILLIAM PARK & ASSOCIATE
930 N. YORK ROAD, SUITE 201
HINSDALE, IL 60521

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