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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
05/15/2018
Application #:
15176346
Filing Dt:
06/08/2016
Publication #:
Pub Dt:
09/29/2016
Inventors:
Yung-Ho Chuang, J. Joseph Armstrong, Justin Dianhuan Liou, Vladimir Dribinski et al
Title:
SEMICONDUCTOR INSPECTION AND METROLOGY SYSTEM USING LASER PULSE MULTIPLIER
Assignment: 1
Reel/Frame:
038841/0186Recorded: 06/08/2016Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
05/24/2012
Exec Dt:
05/30/2012
Exec Dt:
05/31/2012
Exec Dt:
05/31/2012
Exec Dt:
05/31/2012
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
BEVER, HOFFMAN & HARMS, LLP
39500 STEVENSON PLACE
SUITE 209
FREMONT, CA 94539

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