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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
06/12/2018
Application #:
15203846
Filing Dt:
07/07/2016
Publication #:
Pub Dt:
05/18/2017
Inventors:
Akira OKADA, Norihiro TAKESAKO, Hajime AKIYAMA
Title:
APPARATUS AND METHOD FOR EVALUATING SEMICONDUCTOR DEVICE
Assignment: 1
Reel/Frame:
039094/0498Recorded: 07/07/2016Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
05/20/2016
Exec Dt:
05/18/2016
Exec Dt:
05/20/2016
Assignee:
7-3, MARUNOUCHI 2-CHOME, CHIYODA-KU
TOKYO, JAPAN 100-8310
Correspondent:
STUDEBAKER & BRACKETT PC
12700 SUNRISE VALLEY DRIVE
SUITE 102
RESTON, VA 20191
Assignment: 2
Reel/Frame:
054505/0493Recorded: 12/01/2020Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
06/25/2020
Assignee:
21 SAIIN MIZOSAKI-CHO, UKYO-KU
KYOTO, JAPAN 615-8585
Correspondent:
CPA GLOBAL LIMITED
LIBERATION HOUSE
CASTLE STREET
ST HELIER, JE1 1BL JERSEY

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