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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
02/15/2005
Application #:
09729339
Filing Dt:
12/05/2000
Publication #:
Pub Dt:
09/13/2001
Inventor:
Kyoichi Suwa
Title:
MASK, EXPOSURE METHOD, LINE WIDTH MEASURING METHOD, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICES
Assignment: 1
Reel/Frame:
011723/0235Recorded: 04/20/2001Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
04/05/2001
Assignee:
2-3 MARUNOUCHI 3-CHOME
CHIYODA-KU, TOKYO, JAPAN
Correspondent:
OLIFF & BERRIDGE, PLC
JAMES A. OLIFF
P.O. BOX 19928
ALEXANDRIA, VA 22320

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