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Patent Assignment Abstract of Title

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Total Assignments: 2

Patent #:	6433410	Issue Dt:	08/13/2002	Application #:	09821690	Filing Dt:	03/30/2001
Publication #:	20010033010	Pub Dt:	10/25/2001
Inventors:	Michinobu Tanioka, Takahiro Kimura, Yoshihito Fukasawa, Hirobumi Inoue, Hiroo Ito
Title:	SEMICONDUCTOR DEVICE TESTER AND METHOD OF TESTING SEMICONDUCTOR DEVICE

Assignment: 1

Reel/Frame:

011888/0587

Recorded: 06/08/2001

Pages: 3

Conveyance:

ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Assignors:

TANIOKA, MICHINOBU

Exec Dt:

03/28/2001

KIMURA, TAKAHIRO

Exec Dt:

03/28/2001

INOUE, HIROBUMI

Exec Dt:

03/28/2001

ITO, HIROO

Exec Dt:

03/28/2001

FUKASAWA, YOSHIHITO

Exec Dt:

03/28/2001

Assignee:

NEC CORPORATION

7-1, SHIBA 5-CHOME

MINATO-KU, TOKYO, JAPAN

Correspondent:

MCGUIREWOODS LLP

MICHAEL E. WHITHAM

1750 TYSONS BLVD.

SUITE 1800

MCLEAN, VA 22102

Assignment: 2

Reel/Frame:

030166/0055

Recorded: 04/04/2013

Pages: 5

Conveyance:

CORRECTIVE ASSIGNMENT TO CORRECT THE APPLICATION NUMBER PREVIOUSLY RECORDED ON REEL 011888 FRAME 0587. ASSIGNOR(S) HEREBY CONFIRMS THE APPLICATION NUMBER IS 09/821,690, RATHER THAN 09/821,621.

Assignors:

TANIOKA, MICHINOBU

Exec Dt:

03/28/2001