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Patent Assignment Abstract of Title
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Total Assignments: 3
Patent #:
Issue Dt:
01/15/2002
Application #:
09759358
Filing Dt:
01/16/2001
Publication #:
Pub Dt:
01/24/2002
Inventors:
Mitsuhiro Hamada, Kenichi Yasuda
Title:
Semiconductor memory device enabling test of timing standard for strobe signal and data signal with ease, and subsidiary device and testing device thereof
Assignment: 1
Reel/Frame:
011492/0548Recorded: 01/16/2001Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
11/28/2000
Exec Dt:
11/28/2000
Assignee:
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU
TOKYO 100-8310, JAPAN
Correspondent:
MCDERMOTT, WILL & EMERY
STEPHEN A. BECKER
600 13TH STREET, N.W.
WASHINGTON, DC 20005
Assignment: 2
Reel/Frame:
032484/0115Recorded: 03/20/2014Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
03/18/2014
Assignee:
1753, SHIMONUMABE, NAKAHARA-KU
KAWASAKI-SHI
KANAGAWA, JAPAN 211-8668
Correspondent:
STEPHEN A. BECKER
MCDERMOTT WILL & EMERY
500 SOUTH CAPITOL STREET NW
WASHINGTON, DC 20001
Assignment: 3
Reel/Frame:
044928/0001Recorded: 11/29/2017Pages: 235
Conveyance:
CHANGE OF ADDRESS
Assignor:
Exec Dt:
08/06/2015
Assignee:
2-24, TOYOSU 3-CHOME, KOUTOU-KU
TOKYO, JAPAN
Correspondent:
MATTINGLY & MALUR, PC
1800 DIAGONAL ROAD
SUITE 210
ALEXANDRIA, VA 22314

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