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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
03/18/2003
Application #:
09815208
Filing Dt:
03/22/2001
Publication #:
Pub Dt:
04/18/2002
Inventors:
Takeshi Hasegawa, Terumi Ito, Hiroyuki Shiraki
Title:
METHOD AND APPARATUS FOR EVALUATING THE QUALITY OF A SEMICONDUCTOR SUBSTRATE
Assignment: 1
Reel/Frame:
011636/0605Recorded: 03/22/2001Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/07/2001
Exec Dt:
02/07/2001
Exec Dt:
02/07/2001
Assignee:
CHIYODA-KU
5-1 OHTEMACHI 1-CHOME
TOKYO, JAPAN 100-0
Correspondent:
REED SMITH LLP
JULES E. GOLDBERG, ESQ
375 PARK AVENUE
NEW YORK, NEW YORK 10152

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