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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
NONE
Issue Dt:
Application #:
09855295
Filing Dt:
05/14/2001
Publication #:
Pub Dt:
05/02/2002
Inventors:
Jed Foy, Cleston Messick, David Lotourette
Title:
Method and apparatus for the simultaneous electrical testing of multiple semiconductor devices
Assignment: 1
Reel/Frame:
011811/0939Recorded: 05/14/2001Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
04/12/2001
Exec Dt:
04/25/2001
Exec Dt:
04/16/2001
Assignee:
82 RUNNING HILL ROAD, MS 35-4E
SOUTH PORTLAND, MAINE 04106
Correspondent:
TOWNSEND AND TOWNSEND AND CREW LLP
MAYUMI MAEDA
TWO EMBARCADERO CENTER, 8TH FLOOR
SAN FRANCISCO, CALIFORNIA 94111-3834
Assignment: 2
Reel/Frame:
057694/0374Recorded: 08/03/2021Pages: 381
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
07/22/2021
Assignee:
5005 E. MCDOWELL ROAD, MD A700
PHOENIX, ARIZONA 85008
Correspondent:
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
5005 E. MCDOWELL ROAD
MD A700
PHOENIX, AZ 85008

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