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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
02/17/2004
Application #:
09961797
Filing Dt:
09/24/2001
Publication #:
Pub Dt:
06/20/2002
Inventor:
Nobuhito Toyama
Title:
DESIGN CIRCUIT PATTERN FOR TEST OF SEICONDUCTOR CIRCUIT
Assignment: 1
Reel/Frame:
012478/0648Recorded: 01/15/2002Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
11/05/2001
Assignee:
1-1, ICHIGAYA-KAGACHO 1-CHOME
SHINJUKU-KU, TOKYO 162-8001, JAPAN
Correspondent:
FLYNN, THIEL, BOUTELL & TANIS, P.C.
DALE H. THIEL
2026 RAMBLING RD.
KALAMAZOO, MI 49008-1699

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