Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/29/2002
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Application #:
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09909786
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Filing Dt:
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07/23/2001
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Publication #:
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Pub Dt:
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07/25/2002
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Inventors:
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Takashi Hayasaka, Yoshikazu Miyawaki, Atsushi Ohba
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Title:
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SEMICONDUCTOR MEMORY DEVICE WHICH CAN BE SIMULTANEOUSLY TESTED EVEN WHEN THE NUMBER OF SEMICONDUCTOR MEMORY DEVICES IS LARGE AND SEMICONDUCTOR WAFER ON WHICH THE SEMICONDUCTOR MEMORY DEVICES ARE FORMED
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU |
| TOKYO 100-8310, JAPAN |
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| MCDERMOTT, WILL & EMERY |
| STEPHEN A. BECKER |
| 600 13TH STREET, N.W. |
| WASHINGTON, D.C. 20005 |
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