Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10052736
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Filing Dt:
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01/23/2002
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Publication #:
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Pub Dt:
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07/25/2002
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Inventor:
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Satoshi Ikeda
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Title:
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Semiconductor testing apparatus and method
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7-35, KITASHINAGAWA 6-CHOME SHINAGAWA-KU |
| TOKYO, JAPAN |
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| RONALD P. KANANEN, ESQ. |
| RADER, FISHMAN & GRAUER, SUITE 501 |
| 1233 20TH STREET, NW |
| WASHINGTON, D.C. 20036 |
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